C. G. Masi Technology Communications

Home
About Us
Technology Journalism
Technology Trends Library
Online Resources
Contact Us

For The Agency | For The Technology Developer | For The Magazine Publisher | For The Individual

Selected Publications

Editorials
Features
Other

Editorials

  • "Telematics and You," R & D Data Acquisition, December 2001.
  • "The Name of the Rose," R & D Data Acquisition, November 2001.
  • "Seeing Data," R & D Data Acquisition, October 2001.
  • "Electronic Notes," R & D Data Acquisition, September 2001.
  • "Getting on the Right Bus," R & D Data Acquisition, August 2001.
  • "Writing for DAQ Newsletter," R & D Data Acquisition, July 2001.
  • "The Myth of Scientific Fraud," R & D Data Acquisition, June 2001.
  • "The two solutions," R & D Data Acquisition, March 2001.
  • "DAQ vs "the box"," R & D Data Acquisition, February 2001.
  • "Who's Afraid of the Big-Bad VXIbus?," Cal Lab, October 1994.
  • "Registration or Accreditation," Cal Lab, August 1994.
  • "Boundary Scan and the Working Metrologist - II," Cal Lab, July 1994.
  • "Boundary Scan and the Working Metrologist," Cal Lab, June 1994.
  • "Arrested Metrication," Cal Lab, May 1994.
  • "Metrology in a Changing World," Cal Lab, March 1994.
  • "At Last....," Cal Lab, February 1994.
  • "Support Your Local Cal Lab," Test & Measurement World, September 1993.
  • "Climbing Aboard the Green Machine," Test & Measurement World, August 1993.
  • "Torture Testing," Test & Measurement World, July 1993.
  • "Shutting the Motor Off," Motorcycle Tour & Travel, June 1993.
  • "Test & Measurement Europe!," Test & Measurement World, June 1993.
  • "Government Funded Civilian Research," Test & Measurement World, May 1993.
  • "Providing Value," Test & Measurement World, April 1993.
  • "The Golden Path to Quality," Test & Measurement World, March 1993.
  • "The Spirit of Adventure," Motorcycle Tour & Travel, March 1993.
  • "Getting ISOed," Test & Measurement World, January 1993.
  • "R&D Competitiveness," Test & Measurement World, December 1992.
  • "Inspection and the Future of Test," Test & Measurement World, November 1992.
  • "Benchmarking ATE," Test & Measurement World, October 1992.
  • "SPC Makes Testing Obsolete," Test & Measurement World, September 1992.
  • "Say 'Hello' to Martin," Test & Measurement World, August 1992.
  • "Keeping Up," Test & Measurement World, July 1992.
  • "It's Hype If ...," Test & Measurement World, June 1992.
  • "Six Sigma Testing," Test & Measurement World, May 1992.
  • "Shanghaied!," Test & Measurement World, April 1992.
  • "The First Law of Testing," Test & Measurement World, March 1992.
  • "Teaching Test Skills," Test & Measurement World, August 1989.
  • "When Digital Becomes Analog," Test & Measurement World, December 1988.
  • "Seeing the Future," Test & Measurement World, November 1988.
  • "An Insidious Plot," Test & Measurement World, October 1988.
  • "Coping With Technological Limits," Test & Measurement World, September 1988.
  • "How Good is Your Information," Test & Measurement World, August 1988.
  • "The Quest For Quality," Test & Measurement World, June 1988.
  • "Headaches and Challenges," Test & Measurement World, May 1988.
  • "'Less is More' and Other Fiction," Test & Measurement World, April 1988.
  • "Why We Do What We Do," Test & Measurement World, March 1988.
  • "Leaping Ahead," Test & Measurement World, February 1988.
  • "The Human Race Includes a Random Walk," Test & Measurement World, January 1988.
  • "Looking Back and Looking Ahead," Test & Measurement World, December 1987.

Features

  • "Real Time in a CAN," R & D Data Acquisition, November 2001.
  • "CAN: The Little Bus that Could and then Some," R & D Data Acquisition, October 2001.
  • "CAN Provides High Speed with High Reliability," R & D Data Acquisition, September 2001.
  • "CAN: The Little Bus that Could," R & D Data Acquisition, August 2001.
  • "Making the Spectrometer Fit the Need," R&D, February 2001.
  • "Easing Into Molecule Analysis," R&D, February 2001.
  • "Government Lab Expands its Experimental Reign," R&D, December 2000.
  • "Innovation Makes Sensors Smarter and More Networked," R&D, December 2000.
  • "Test Drive a Microscope," Test & Measurement World, November 2000.
  • "Data Mining Can Tame Mountains of Information," R&D, November 2000.
  • "Data Mining Can Tame Mountains of Information," R&D, November 2000.
  • "Key Microscope Specs Guide Buying Decisions," Test & Measurement World, October 2000.
  • "Implanter Technology Grows Up," R&D, October 2000.
  • "Proper Lighting Gets the Most from Microscope Images," Test & Measurement World, September 2000.
  • "Going Beyond Copper Interconnects," R&D, July 2000.
  • "Light Characteristics Limit Optical Quality," Test & Measurement World, June 2000.
  • "Basic Optical Effects Limit Image Quality," Test & Measurement World, May 2000.
  • "Microscopes Rely on Basic Optical Components," Test & Measurement World, April 2000.
  • "Old Microscopes Learn New Tricks," Test & Measurement World, January 2000.
  • "Environmental Testing Gets Practical," Quality & R&D, August 1999.
  • "Two Instrument Interface Standards Target Similar Goals," R&D, May 1999.
  • "Software Smartens Up Data Manipulation," IEEE Spectrum, April 1999.
  • "How To Build a Data Acquisition System in 4 Steps," R&D, March 1999.
  • "Technology 1999 Analysis & Forecast: Test & Measurement," IEEE Spectrum, January 1999.
  • "Analysis Software Shapes Data Into Useable Results," R&D, January 1999.
  • "UV Microscopes Inspect Submicron Features," Test & Measurement World, December 1998.
  • "The Future of Computerized Data-Gathering Instrumentation," R&D, December 1998.
  • "Scatterometry Is Key to Advanced Thin-Film Processing," R&D, December 1998.
  • "Internet Access Expands Reach of Data Acquisition," R&D, November 1998.
  • "Smart Instruments Make Doctors' Jobs Easier," R&D, August 1998.
  • "Metrology Blazes the Trail To Smaller Semiconductors," R&D, July 1998.
  • "Automated Instruments Are Becoming 'Smarter'," R&D, June 1998.
  • "Lighting Makes Its Mark on Vision Systems," Test & Measurement World, May 1998.
  • "Mixed Protocols Intrinsic to DAQ Applications," R&D, May 1998.
  • "Moisture Analysis Crucial to Success," R&D, April 1998.
  • "Automotive Testing Demands Dedicated DAQ," R&D, March 1998.
  • "SPMs Tackle Manufacturing Inspection Tasks," Test & Measurement World, March 1998.
  • "Particle Analyzers Keep Processes in Control," R&D, February 1998.
  • "LCs and GCs Performing Dual Roles in Industry," R&D, January 1998.
  • "Test & Measurement 1998 Technology Analysis & Forecast," IEEE Spectrum, January 1998.
  • "Turbocharging IEEE-488," R&D, December 1997.
  • "Smart Equipment Tells Where It Hurts," R&D, November 1997.
  • "Alphabet Soup and Temperature Measurement," R&D, October 1997.
  • "Data Recording's Greatest Hits," R&D, August 1997.
  • "Developing an Interactive Television System That Works," R&D, June 1997.
  • "Developing an Interactive Television System that Works," R&D, June 1997.
  • "Power Supply Research Ensures Telecom's Reliability," R&D, June 1997.
  • "Power Supply Research Ensures Telecom's Reliability," R&D, June 1997.
  • "High Tech on the Highway," R&D, April 1997.
  • "Scanning Probe Microscopy Earns Its Keep in Industry," R&D, March 1997.
  • "Remote Monitoring," R&D, February 1997.
  • "Jet-Engine Tests Simulate Real-World Hazards," R&D, January 1997.
  • "Spectroscopic Techniques Peer Into Combustion-Chamber Chemistry," R&D, December 1996.
  • "Putting 'Quiet Shoes' on Household Appliances," R&D, November 1996.
  • "Automating Sensors for the Global Data Set," R&D, October 1996.
  • "Testing Cars an Exact Science," R&D, March 1996.
  • "Image-Archiving Software Saves the Big Picture for Posterity," R&D, February 1996.
  • "GPS Plugging into the Space-Time Grid," R&D, January 1996.
  • "Re-Engineering Engineering Education," IEEE Spectrum, September 1995.
  • "R&D100 Winner Makes Quick Work of Thin-Film Characterization," R&D, November 1994.
  • "How Board Testers are Changing in the '90s," Electronic Business Buyer, October 1994.
  • "How to Win Big in a Stagnant Market," Electronic Business Buyer, October 1994.
  • "Automated Inspection Boosts PCB Quality," Test & Measurement World, August 1994.
  • "Automated Inspection Boosts PCB Quality," Test & Measurement World, August 1994.
  • "Find (and Stop) That Spill!," R&D, August 1994.
  • "Henry Sostmann Receives 1994 Wildhack Award," Cal Lab, August 1994.
  • "Large Object Calibration Service Started," Cal Lab, August 1994.
  • "Oak Ridge Y-12 Plant," Cal Lab, August 1994.
  • "Calibration Lab Accreditation Program Starts Up," Cal Lab, July 1994.
  • "Measuring Complex Signals with Digital Scopes and AWGs," R&D, June 1994.
  • "Computers Boost Productivity of Universal Test Machines," R&D, May 1994.
  • "Increasing Materials Testing Productivity Through Computerization," R&D, May 1994.
  • "DSOs and AWGS: Source and Measure for Complex Signals," R&D, April 1994.
  • "Probe-Point Cutting Makes IC Backtracing Practical," EDN Products Edition, March 1994.
  • "GenRad Repositions for Growth," Electronic Business Buyer, February 1994.
  • "Process Controllers Keep Experiments on Track," R&D, February 1994.
  • "Benchtop Power Supplies and How to Find Them," R&D, January 1994.
  • "Choosing the Right Benchtop Power Supply," R&D, January 1994.
  • "GenRad Chief Angered by Mismanagement," Electronic Business Buyer, January 1994.
  • "New Options for Data Capture," R&D, December 1993.
  • "Schlumberger Climbs Back to the Top," Electronic Business Buyer, December 1993.
  • "Advantest America Builds for the Future," Electronic Business Buyer, November 1993.
  • "Sniffing Out Toxic Gas Leaks," R&D, November 1993.
  • "Hyperion Gets a New Life," Electronic Business Buyer, October 1993.
  • "Structured Programming in BASIC," Test & Measurement World, October 1993.
  • "Fisherman's Wharf, San Francisco," Motorcycle Tour & Travel, June 1993.
  • "Shelburne Falls, Massachusetts," Motorcycle Tour & Travel, June 1993.
  • "1993 FLHTC Ultra Classic Electra Glide," Motorcycle Tour & Travel, March 1993.
  • "Baltimore's Inner Harbor," Motorcycle Tour & Travel, March 1993.
  • "Choosing the Right Helmet," Motorcycle Tour & Travel, March 1993.
  • "Interferometric OTDRS," Test & Measurement World, October 1992.
  • "Measuring Polarization Dispersion," Test & Measurement World, October 1992.
  • "What Is Your Draw Tension," Test & Measurement World, October 1992.
  • "A Bridge from Design to Inspection!," Test & Measurement World, September 1992.
  • "Design for Inspectability," Test & Measurement World, July 1992.
  • "OTDR Selection Criteria," Test & Measurement World, July 1992.
  • "Arizona Heat," American Iron Magazine, May 1992.
  • "EMP Simulation with an AWG," Test & Measurement World, May 1992.
  • "Fun with S - Parameters," Test & Measurement World, May 1992.
  • "Selecting an Optical Microscope," Test & Measurement World, February 1992.
  • "Testing VLSI Devices in the 1990's: Part of a New Way to Do Business," Keynote speech at 1991 VLSI Testing Conference, April 1991.
  • "In Search of Laser Diode Tests - Part 2," Test & Measurement World, August 1990.
  • "Scanning Tunneling Microscopy: A Basic Exploration," Microscope Technology and News, July 1990.
  • "In Search of Laser Diode Tests - Part 1," Test & Measurement World, June 1990.
  • "Live Depth Perception for SEMS," Test & Measurement World, June 1990.
  • "Specifying Satisfaction," AMP Designer Digest, June 1990.
  • "Pick Yourself an SEM," Test & Measurement World, May 1990.
  • "An STM for Submicron Metrology," Test & Measurement World, April 1990.
  • "Maintaining Fiber Test Equipment Becomes Top Priority," Test & Measurement World, April 1990.
  • "Selecting an Optical Microscope and Getting Your Money's Worth," Microscope Technology and News, April 1990.
  • "Assemble Your Own Imaging System," Test & Measurement World, March 1990.
  • "Group Delay Dispersion Measurements in Optical Amplifiers," Test & Measurement World, March 1990.
  • "So ... You Want to Measure Submicron Dimensions," Test & Measurement World, March 1990.
  • "Correcting Power Measurements for Connector Loss," Test & Measurement World, February 1990.
  • "How Digital Scopes Do Signal Analysis," Test & Measurement World, February 1990.
  • "Microbending Loss Measurements Require Random-Bend Fixtures," Test & Measurement World, February 1990.
  • "Imaging with Icons," Test & Measurement World, December 1989.
  • "Measuring Mode Coupling In Polarization-Maintaining Fibers," Test & Measurement World, December 1989.
  • "Ion Beam Inspects and Modifies ICs," Test & Measurement World, November 1989.
  • "AOI System Verifies DIP Markings," Test & Measurement World, September 1989.
  • "Detection Methods Show Superiority for Different Fiber Lengths," Test & Measurement World, September 1989.
  • "Optical Microscopes in Semiconductor Inspection," Test & Measurement World, August 1989.
  • "Advanced Techniques Inspect Advanced Products," Test & Measurement World, October 1988.
  • "Choosing a Digital Oscilloscope," Test & Measurement World, October 1988.
  • "How Digital Scopes Sample," Test & Measurement World, October 1988.
  • "The Right Way to Use Image Analyzers," Test & Measurement World, September 1988.
  • "Selecting an optical Microscope," Test & Measurement World, August 1988.
  • "What Can Thermal Imaging Do For You?," Test & Measurement World, May 1988.
  • "Using Attenuators to Test High-Power Lasers," Test & Measurement World, April 1988.
  • "What Capacitance is This Capacitor?" with B.J. Thompson," Test & Measurement World, February 1988.
  • "Planning OTDR PurchaBeB," Test & Measurement World, January 1988.
  • "Electronic Inspection in the Early 1990s," Test & Measurement World, December 1987.
  • "Electro-optics Testing in the Next Decade," Test & Measurement World, December 1987.
  • "Solutions to Current Problems in ATE Fixturing," Test & Measurement World, December 1987.
  • "Magnetic Resonance Imaging Using Permanent Magnets," Proceedings of Application of Optical Instrumentation in Medicine XI, June 1983.
  • "Lodestone' Technology Comes to NMR Imaging," Diagnostic Imaging, April 1983.
  • "Temperature Control of a Tungsten Incandescent Lamp," Review of Scientific instruments, February 1979.

Other

  • "Guide to Handheld Multimeters," R&D, January 1996.
  • "Viscometry Goes from Stone Knives to High Tech," R&D, December 1995.
 

Home | About Us | Technology Journalism | Technology Trends Library | Online Resources | Contact Us
For The Agency | For The Technology Developer | For The Magazine Publisher | For The Individual

© , C. G. Masi Technology Communications, Privacy Policy
1005 Garfield Avenue, Aurora, IL 60506, USA
Phone: +1-630-892-1579, Fax: +1-630-892-1589, Email: cgmasi@cgmasi.com, Web: www.cgmasi.com
Developed by Telesian Technology Inc.